PLADE: A Plane-based Descriptor for Point Cloud Registration with Small Overlap

Songlin Chen Liangliang Nan Renbo Xia Jibin Zhao Peter Wonka

Geometric Analysis and Geometric Topology Geometric Modeling and Processing mathscidoc:2106.15003

IEEE Transactions on Geoscience and Remote Sensing, 58, (4), 2530-2540, 2020.4
Traditional point cloud registration methods require large overlap between scans, which imposes strict constraints on data acquisition. To facilitate registration, users have to carefully position scanners to ensure sufficient overlap. In this work, we propose to use high-level structural information (i.e., plane/line features and their inter-relationship) for registration, which is capable of registering point clouds with small overlap, allowing more freedom in data acquisition. We design a novel plane/linebased descriptor dedicated to establishing structure level correspondences between point clouds. Based on this descriptor, we propose a simple but effective registration algorithm. We also provide a dataset of real-world scenes containing a larger number of scans with a wide range of overlap. Experiments and comparisons with state-of-the-art methods on various datasets reveal that our method is superior to existing techniques. Though the proposed algorithm outperforms state-of-the-art methods on the most challenging dataset, the point cloud registration problem is still far from being solved, leaving significant room for improvement and future work.
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@inproceedings{songlin2020plade:,
  title={PLADE: A Plane-based Descriptor for Point Cloud Registration with Small Overlap},
  author={Songlin Chen, Liangliang Nan, Renbo Xia, Jibin Zhao, and Peter Wonka},
  url={http://archive.ymsc.tsinghua.edu.cn/pacm_paperurl/20210621152110995390844},
  booktitle={IEEE Transactions on Geoscience and Remote Sensing},
  volume={58},
  number={4},
  pages={2530-2540},
  year={2020},
}
Songlin Chen, Liangliang Nan, Renbo Xia, Jibin Zhao, and Peter Wonka. PLADE: A Plane-based Descriptor for Point Cloud Registration with Small Overlap. 2020. Vol. 58. In IEEE Transactions on Geoscience and Remote Sensing. pp.2530-2540. http://archive.ymsc.tsinghua.edu.cn/pacm_paperurl/20210621152110995390844.
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