We study inhomogeneous random graphs in the subcritical case. Among other results, we derive an exact formula for the size of the largest connected component scaled by log$n$, with$n$being the size of the graph. This generalizes a result for the “rank-1 case”. We also investigate branching processes associated with these graphs. In particular, we discover that the same well-known equation for the survival probability, whose positive solution determines the asymptotics of the size of the largest component in the supercritical case, also plays a crucial role in the subcritical case. However, now it is the$negative$solutions that come into play. We disclose their relationship to the distribution of the progeny of the branching process.

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In this paper, we formulate a problem of simultaneous redundant via insertion and line end extension for via yield optimization. Our problem is more general than previous works in the sense that more than one type of line end extension is considered and the objective function to be optimized directly accounts for via yield. We present a zero-one integer linear program based approach, that is equipped with two speedup techniques, to solve the addressed problem optimally. In addition, we describe how to modify our approach to exactly solve a previous work. Extensive experimental results are shown to demonstrate the effectiveness and efficiency of our approaches.

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