3-D CAD models are an important digital resource in the manufacturing industry. 3-D CAD model retrieval has become a key technology in product lifecycle management enabling the reuse of existing design data. In this paper, we propose a new method to retrieve 3-D CAD models based on 2-D pen-based sketch inputs. Sketching is a common and convenient method for communicating design intent during early stages of product design, e.g., conceptual design. However, converting sketched information into precise 3-D engineering models is cumbersome, and much of this effort can be avoided by reuse of existing data. To achieve this purpose, we present a user-adaptive sketch-based retrieval method in this paper. The contributions of this work are twofold. First, we propose a statistical measure for CAD model retrieval: the measure is based on sketch similarity and accounts for users’ drawing habits. Second, for 3-D CAD models in the database, we propose a sketch generation pipeline that represents each 3-D CAD model by a small yet sufficient set of sketches that are perceptually similar to human drawings. User studies and experiments that demonstrate the effectiveness of the proposed method in the design process are presented.

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This paper analyzes the random fluctuations obtained by a heterogeneous multi-scale first-order finite element method applied to solve elliptic equations with a random potential. Several multiscale numerical algorithms have been shown to correctly capture the homogenized limit of solutions of elliptic equations with coefficients modeled as stationary and ergodic random fields. Because theoretical results are available in the continuum setting for such equations, we consider here the case of a secondorder elliptic equations with random potential in two dimensions of space. We show that the random fluctuations of such solutions are correctly estimated by the heterogeneous multi-scale algorithm when appropriate fine-scale problems are solved on subsets that cover the whole computational domain. However, when the fine-scale problems are solved over patches that do not cover the entire domain, the random fluctuations may or may not be estimated accurately. In the case of random potentials with short-range interactions, the variance of the random fluctuations is amplified as the inverse of the fraction of the medium covered by the patches. In the case of random potentials with long-range interactions, however, such an amplification does not occur and random fluctuations are correctly captured independent of the (macroscopic) size of the patches. These results are consistent with those obtained in [9] for more general equations in the one-dimensional setting and provide indications on the loss in accuracy that results from using coarser, and hence computationally less intensive, algorithms.